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Microscopy

Microscopy

Novel microscopy techniques find needles in ‘big data’ haystacks

27 Aug 2019
This article first appeared in the 2019 Physics World Focus on Instruments and Vacuum under the headline "Finding needles in haystacks"

Martin Jones describes how new approaches to electron microscopy are helping biomedical scientists get the most out of ever-increasing flows of data

A focused ion beam scanning electron microscope (FIB SEM).
Thinly sliced This focused ion beam scanning electron microscope (FIB SEM) uses a beam of gallium ions to slice through the sample in steps of just a few nanometres, allowing researchers to collect 3D images. (Courtesy: Lucy Collinson, Crick Institute)
Most of you are probably familiar with at least some of the “big data” involved in biomedical re

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