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Microscopy

Microscopy

X-ray microscopy sharpens up

19 Jul 2022 Isabelle Dumé
imperfect lenses
Constructing a sharp image of precisely arranged concentric layers to image two semiconductor nanowires. (Courtesy: Markus Osterhoff)
A new algorithm that compensates for deficiencies in X-ray lenses could make images from X-ray micro

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Isabelle Dumé is a contributing editor to Physics World
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